Ring Resonator Measurement: Characterizing High Dielectric Constant Materials for the Fourth Industrial Revolution

Abstract

This study introduces a ring resonator measurement technique targeting high dielectric constant materials. Operating within a frequency range of 0.1 GHz to 5 GHz, the resonator utilizes FR4 substrate and copper conductor. A significant departure from existing methods involves employing a silver-coated ring directly on the sample, mitigating Wheeler's gap issue induced by airgaps across material layers. Furthermore, the research reveals that as dielectric constants increase, microstrip line impedance drastically falls below 25 ohms, potentially leading to inaccurate loss tangent determinations. This paper focuses solely on HFSS simulations to demonstrate the method's feasibility. The proposed technique offers promising prospects for accurately characterizing high dielectric constant materials, thereby facilitating advancements in various applications, particularly within the Fourth Industrial Revolution framework- 5G and 6G technologies.